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    Nonlinear analysis of a crack in 2D piezoelectric semiconductors with exact electric boundary conditions

    Access Status
    Fulltext not available
    Authors
    Zhao, M.H.
    Li, X.F.
    Lu, Chunsheng
    Zhang, Q.Y.
    Date
    2021
    Type
    Journal Article
    
    Metadata
    Show full item record
    Citation
    Zhao, M.H. and Li, X.F. and Lu, C. and Zhang, Q.Y. 2021. Nonlinear analysis of a crack in 2D piezoelectric semiconductors with exact electric boundary conditions. Journal of Intelligent Material Systems and Structures. 32 (6): pp. 632-639.
    Source Title
    Journal of Intelligent Material Systems and Structures
    DOI
    10.1177/1045389X20963168
    ISSN
    1045-389X
    Faculty
    Faculty of Science and Engineering
    School
    School of Civil and Mechanical Engineering
    URI
    http://hdl.handle.net/20.500.11937/83418
    Collection
    • Curtin Research Publications
    Abstract

    In this paper, taking the exact electric boundary conditions into account, we propose a double iteration method to analyze a crack problem in a two-dimensional piezoelectric semiconductor. The method consists of a nested loop process with internal and outside circulations. In the former, the electric field and electron density in governing equations are constantly modified with the fixed boundary conditions on crack face and the crack opening displacement; while in the latter, the boundary conditions on crack face and the crack opening displacement are modified. Such a method is verified by numerically analyzing a crack with an impermeable electric boundary condition. It is shown that the electric boundary condition on crack face largely affects the electric displacement intensity factor near a crack tip in piezoelectric semiconductors. Under exact crack boundary conditions, the variation tendency of the electric displacement intensity factor versus crack size is quite different from that under an impermeable boundary condition. Thus, exact crack boundary conditions should be adopted in analysis of crack problems in a piezoelectric semiconductor.

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