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dc.contributor.authorZhao, M.H.
dc.contributor.authorLi, X.F.
dc.contributor.authorLu, Chunsheng
dc.contributor.authorZhang, Q.Y.
dc.date.accessioned2021-05-05T02:30:53Z
dc.date.available2021-05-05T02:30:53Z
dc.date.issued2021
dc.identifier.citationZhao, M.H. and Li, X.F. and Lu, C. and Zhang, Q.Y. 2021. Nonlinear analysis of a crack in 2D piezoelectric semiconductors with exact electric boundary conditions. Journal of Intelligent Material Systems and Structures. 32 (6): pp. 632-639.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/83418
dc.identifier.doi10.1177/1045389X20963168
dc.description.abstract

In this paper, taking the exact electric boundary conditions into account, we propose a double iteration method to analyze a crack problem in a two-dimensional piezoelectric semiconductor. The method consists of a nested loop process with internal and outside circulations. In the former, the electric field and electron density in governing equations are constantly modified with the fixed boundary conditions on crack face and the crack opening displacement; while in the latter, the boundary conditions on crack face and the crack opening displacement are modified. Such a method is verified by numerically analyzing a crack with an impermeable electric boundary condition. It is shown that the electric boundary condition on crack face largely affects the electric displacement intensity factor near a crack tip in piezoelectric semiconductors. Under exact crack boundary conditions, the variation tendency of the electric displacement intensity factor versus crack size is quite different from that under an impermeable boundary condition. Thus, exact crack boundary conditions should be adopted in analysis of crack problems in a piezoelectric semiconductor.

dc.titleNonlinear analysis of a crack in 2D piezoelectric semiconductors with exact electric boundary conditions
dc.typeJournal Article
dcterms.source.volume32
dcterms.source.number6
dcterms.source.startPage632
dcterms.source.endPage639
dcterms.source.issn1045-389X
dcterms.source.titleJournal of Intelligent Material Systems and Structures
dc.date.updated2021-05-05T02:30:52Z
curtin.departmentSchool of Civil and Mechanical Engineering
curtin.accessStatusFulltext not available
curtin.facultyFaculty of Science and Engineering
curtin.contributor.orcidLu, Chunsheng [0000-0002-7368-8104]
dcterms.source.eissn1530-8138
curtin.contributor.scopusauthoridLu, Chunsheng [57061177000]


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