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dc.contributor.authorReusch, T.
dc.contributor.authorRadny, M.
dc.contributor.authorSmith, P.
dc.contributor.authorWarschkow, O.
dc.contributor.authorMarks, Nigel
dc.contributor.authorCurson, N.
dc.contributor.authorMcKenzie, D.
dc.contributor.authorSimmons, M.
dc.date.accessioned2017-01-30T11:06:38Z
dc.date.available2017-01-30T11:06:38Z
dc.date.created2014-10-08T03:10:53Z
dc.date.issued2007
dc.identifier.citationReusch, T. and Radny, M. and Smith, P. and Warschkow, O. and Marks, N. and Curson, N. and McKenzie, D. et al. 2007. Single Phosphorus Atoms in Si(001): Doping-Induced Charge Transfer into Isolated Si Dangling Bonds. Journal of Physical Chemistry. 111: pp. 6428-6433.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/8440
dc.publisherAmerican Chemical Society
dc.titleSingle Phosphorus Atoms in Si(001): Doping-Induced Charge Transfer into Isolated Si Dangling Bonds
dc.typeJournal Article
dcterms.source.volume111
dcterms.source.startPage6428
dcterms.source.endPage6433
dcterms.source.issn0022-3654
dcterms.source.titleJournal of Physical Chemistry
curtin.accessStatusFulltext not available


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