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    Bending characteristics of a one-dimensional piezoelectric semiconductor curved beam

    Access Status
    Fulltext not available
    Authors
    Zhang, Q.
    Xu, J.
    Wang, B.
    Zhao, M.
    Lu, Chunsheng
    Date
    2024
    Type
    Journal Article
    
    Metadata
    Show full item record
    Citation
    Zhang, Q. and Xu, J. and Wang, B. and Zhao, M. and Lu, C. 2024. Bending characteristics of a one-dimensional piezoelectric semiconductor curved beam. Archive of Applied Mechanics. 94 (10): pp. 2807-2818.
    Source Title
    Archive of Applied Mechanics
    DOI
    10.1007/s00419-024-02641-2
    ISSN
    0939-1533
    Faculty
    Faculty of Science and Engineering
    School
    School of Civil and Mechanical Engineering
    URI
    http://hdl.handle.net/20.500.11937/96162
    Collection
    • Curtin Research Publications
    Abstract

    A one-dimensional beam model with a curved longitudinal axis is established for piezoelectric semiconductors (PSCs) based on the first-order shear deformation theory and a small perturbation assumption of electron concentration. The PSC curved beam model is studied with one fixed end and a transverse force under the other end, and the analytical solutions of shear displacement, flexure displacement, electric potential, and electron concentration perturbation are derived using the differential operator method. The solutions of electromechanical fields are verified by degrading a curved beam into a straight one. According to numerical results, the distributions of electromechanical fields and effects of transverse force, initial electron concentration, and curvature radius are discussed on electromechanical fields. It is shown that the transverse force and curvature radius have an obvious influence on both the electrical and mechanical fields of the curved PSC beam, whereas the initial electron concentration mainly affects electrical quantities.

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