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The Maia detector array and x-ray fluorescence imaging system: Locating rare precious metal phases in complex samples

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Open access
Authors
Ryan, Chris
Siddons, D.
Kirkham, R.
Li, Z.
De Jonge, M.
Paterson, D.
Cleverley, J.
Kuczewski, A.
Dunn, P.
Jensen, M.
De Geronimo, G.
Howard, D.
Godel, B.
Dyl, K.
Fisher, L.
Hough, R.
Barnes, S.
Bland, Phil
Moorhead, G.
James, S.
Spiers, K.
Falkenberg, G.
Boesenberg, U.
Wellenreuther, G.
Date
2013
Type
Conference Paper

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Citation
Ryan, C. and Siddons, D. and Kirkham, R. and Li, Z. and De Jonge, M. and Paterson, D. and Cleverley, J. et al. 2013. The Maia detector array and x-ray fluorescence imaging system: Locating rare precious metal phases in complex samples. X-Ray Nanoimaging: Instruments and Methods. Proceedings of SPIE. 8851: 88510Q.
Source Title
Proceedings of SPIE - The International Society for Optical Engineering
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Faculty
Curtin Business School (CBS)
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Copyright 2013 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

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Abstract

X-ray fluorescence images acquired using the Maia large solid-angle detector array and integrated real-time processor on the X-ray Fluorescence Microscopy (XFM) beamline at the Australian Synchrotron capture fine detail in complex natural samples with images beyond 100M pixels. Quantitative methods permit real-time display of deconvoluted element images and for the acquisition of large area XFM images and 3D datasets for fluorescence tomography and chemical state (XANES) imaging. This paper outlines the Maia system and analytical methods and describes the use of the large detector array, with a wide range of X-ray take-off angles, to provide sensitivity to the depth of features, which is used to provide an imaging depth contrast and to determine the depth of rare precious metal particles in complex geological samples. © 2013 SPIE.