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    Maia X-ray fluorescence imaging: Capturing detail in complex natural samples

    245745_245745.pdf (8.138Mb)
    Access Status
    Open access
    Authors
    Ryan, Chris
    Siddons, D.
    Kirkham, R.
    Li, Z.
    De Jonge, M.
    Paterson, D.
    Kuczewski, A.
    Howard, D.
    Dunn, P.
    Falkenberg, G.
    Boesenberg, U.
    De Geronimo, G.
    Fisher, L.
    Halfpenny, A.
    Lintern, M.
    Lombi, E.
    Dyl, K.
    Jensen, M.
    Moorhead, G.
    Cleverley, J.
    Hough, R.
    Godel, B.
    Barnes, S.
    James, S.
    Spiers, K.
    Alfeld, M.
    Wellenreuther, G.
    Vukmanovic, Z.
    Borg, S.
    Date
    2014
    Type
    Conference Paper
    
    Metadata
    Show full item record
    Citation
    Ryan, C. and Siddons, D. and Kirkham, R. and Li, Z. and De Jonge, M. and Paterson, D. and Kuczewski, A. et al. 2014. Maia X-ray fluorescence imaging: Capturing detail in complex natural samples. Journal of Physics: Conference Series. 499: 012002.
    Source Title
    Journal of Physics: Conference Series
    DOI
    10.1088/1742-6596/499/1/012002
    ISSN
    1742-6588
    Faculty
    Curtin Business School (CBS)
    Remarks

    Published under licence in Journal of Physics: Conference Series by IOP Publishing Ltd. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

    URI
    http://hdl.handle.net/20.500.11937/46545
    Collection
    • Curtin Research Publications
    Abstract

    Motivated by the challenge of capturing complex hierarchical chemical detail in natural material from a wide range of applications, the Maia detector array and integrated realtime processor have been developed to acquire X-ray fluorescence images using X-ray Fluorescence Microscopy (XFM). Maia has been deployed initially at the XFM beamline at the Australian Synchrotron and more recently, demonstrating improvements in energy resolution, at the P06 beamline at Petra III in Germany. Maia captures fine detail in element images beyond 100 M pixels. It combines a large solid-angle annular energy-dispersive 384 detector array, stage encoder and flux counter inputs and dedicated FPGA-based real-time event processor with embedded spectral deconvolution. This enables high definition imaging and enhanced trace element sensitivity to capture complex trace element textures and place them in a detailed spatial context. Maia hardware and software methods provide per pixel correction for dwell, beam flux variation, dead-time and pileup, as well as off-line parallel processing for enhanced throughput. Methods have been developed for real-time display of deconvoluted SXRF element images, depth mapping of rare particles and the acquisition of 3D datasets for fluorescence tomography and XANES imaging using a spectral deconvolution method that tracks beam energy variation. © Published under licence by IOP Publishing Ltd.

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