A combined voltammetric and synchrotron radiation-grazing incidence X-ray diffraction study of the electrocrystallization of zinc tetracyanoquinodimethane
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The in situ electrocrystallization of zinc tetracyanoquinodimethane (TCNQ) has been explored using synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD) at potentials in the region of the cyclic voltammetric peak where reduction of TCNQ to TCNQ– occurs at a Pt electrode in acetonitrile (0.1 M [NBu4][PF6]) solution containing Zn(NO3)2·6H2O. The in situ SR-GIXRD data along with ex situ IR and Raman spectroscopy results all confirmed the formation of the kinetically favoured phase of Zn[TCNQ]2(H2O)2 as the product.
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Tuning the Electrocrystallization Parameters of Semiconducting Co[TCNQ]2-Based Materials To Yield either Single Nanowires or Crystalline Thin FilmsNafady, A.; Bond, A.; Bilyk, A.; Harris, A.; Bhatt, A.; O'Mullane, A.; De Marco, Roland (2007)Abstract:Electrocrystallization of single nanowires and/or crystalline thin films of the semiconducting and magnetic Co[TCNQ]2(H2O)2 (TCNQ = tetracyanoquinodimethane) charge-transfer complex onto glassy carbon, indium tin ...
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