Comment on "On the tensile strength distribution of multiwalled carbon nanotubes" [Appl. Phys. Lett. 87, 203106 (2005)]
| dc.contributor.author | Lu, Chunsheng | |
| dc.date.accessioned | 2017-01-30T13:04:05Z | |
| dc.date.available | 2017-01-30T13:04:05Z | |
| dc.date.created | 2009-05-14T02:17:16Z | |
| dc.date.issued | 2008 | |
| dc.identifier.citation | Lu, Chunsheng. 2008. Comment on "On the tensile strength distribution of multiwalled carbon nanotubes" [Appl. Phys. Lett. 87, 203106 (2005)]. Applied Physics Letters. 92 (20): pp. 206101-1-206101-2. | |
| dc.identifier.uri | http://hdl.handle.net/20.500.11937/28264 | |
| dc.identifier.doi | 10.1063/1.2927304 | |
| dc.description.abstract |
In a recent letter, Barber, Andrews, Schadler, and Wagner, Appl. Phys. Lett. 87, 203106 (2005). indicated that Weibull-Poisson statistics could accurately model the nanotube tensile strength data, and then concluded that the apparent strengthening mechanism in a multiwalled carbon nanotube (MWCNT) grown by chemical vapor deposition (CVD) is most likely caused by an enhanced interaction between the walls of the nanotube. In this comment, we show that their conclusion seems to be inconsistent with the assumption introduced in the data analysis by using a two-parameter Weibull distribution. Further statistical analysis provides a new explanation on the scattered strengths of MWCNTs. The effectiveness of Weibull-Poisson statistics at nanoscales is also discussed. ©2008 American Institute of Physics | |
| dc.publisher | American Institute of Physics | |
| dc.title | Comment on "On the tensile strength distribution of multiwalled carbon nanotubes" [Appl. Phys. Lett. 87, 203106 (2005)] | |
| dc.type | Journal Article | |
| dcterms.source.volume | 92 | |
| dcterms.source.number | 20 | |
| dcterms.source.startPage | 206101 | |
| dcterms.source.endPage | 1 | |
| dcterms.source.issn | 00036951 | |
| dcterms.source.title | Applied Physics Letters | |
| curtin.note |
Copyright © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. | |
| curtin.note |
This article appeared in Appl. Phys. Lett. / Volume 92 / Issue 20 / COMMENTS published 19 May 2008 and may be found at: | |
| curtin.accessStatus | Open access via publisher | |
| curtin.faculty | Faculty of Science and Engineering | |
| curtin.faculty | Department of Mechanical Engineering | |
| curtin.faculty | School of Civil and Mechanical Engineering |