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dc.contributor.authorShi, Y.
dc.contributor.authorXue, F.
dc.contributor.authorLi, C.
dc.contributor.authorZhao, Q.
dc.contributor.authorQu, Z.
dc.contributor.authorLi, Xin Yong
dc.identifier.citationShi, Y. and Xue, F. and Li, C. and Zhao, Q. and Qu, Z. and Li, X.Y. 2012. Effects of hydrothermal annealing on characteristics of CuInS 2 thin films by SILAR method. Applied Surface Science. 258 (19): pp. 7465-7469.

CuInS2 thin films have been deposited by successive ionic layer absorption and reaction (SILAR) method, then annealed in a Na2S solution (denoted as hydrothermal annealing) at 200 °C for different time. The effect of hydrothermal annealing on the properties of the films was studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM) and optical absorption spectroscopy. The XRD, TEM and SEM results indicate that well-crystallized CuInS2 films could be obtained after annealing in 0.1 mol/L Na2S solution for 1.5 h. The annealed CuInS2 films were slightly S-rich and the direct band gap varied from 1.32 to 1.58 eV as the annealing time increased from 0.5 h to 2 h.

dc.titleEffects of hydrothermal annealing on characteristics of CuInS 2 thin films by SILAR method
dc.typeJournal Article
dcterms.source.titleApplied Surface Science
curtin.departmentDepartment of Chemical Engineering
curtin.accessStatusFulltext not available

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