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    Synthesis and characterisation of ion-implanted epoxy composites for X-ray shielding

    Access Status
    Fulltext not available
    Authors
    Noor Azman, N.
    Siddiqu, S.
    Ionescu, M.
    Low, Jim
    Date
    2012
    Type
    Journal Article
    
    Metadata
    Show full item record
    Citation
    Noor Azman, N. Z. and Siddiqu, S. A. and Ionescu, M. and Low, I. M. 2012. Synthesis and characterisation of ion-implanted epoxy composites for X-ray shielding. Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms. 287: pp. 120–123.
    Source Title
    Nuclear Instruments and Methods in Physics Research B.
    DOI
    10.1016/j.nimb.2012.06.004
    ISSN
    0305-1048
    URI
    http://hdl.handle.net/20.500.11937/4516
    Collection
    • Curtin Research Publications
    Abstract

    The epoxy samples were implanted with heavy ions such as tungsten (W), gold (Au) and lead (Pb) to investigate the attenuation characteristics of these composites. Near-surface composition depth profiling of ion-implanted epoxy systems was studied using Rutherford Backscattering Spectroscopy (RBS). The effect of implanted ions on the X-ray attenuation was studied with a general diagnostic X-ray machine with X-ray tube voltages from 40 to 100 kV at constant exposure 10 mAs. Results show that the threshold of implanted ions above which X-ray mass attenuation coefficient, µm of the ion-implanted epoxy composite is distinguishably higher than the µm of the pure epoxy sample is different for W, Au and Pb.

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