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dc.contributor.authorNoor Azman, N.
dc.contributor.authorSiddiqu, S.
dc.contributor.authorIonescu, M.
dc.contributor.authorLow, Jim
dc.identifier.citationNoor Azman, N. Z. and Siddiqu, S. A. and Ionescu, M. and Low, I. M. 2012. Synthesis and characterisation of ion-implanted epoxy composites for X-ray shielding. Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms. 287: pp. 120–123.

The epoxy samples were implanted with heavy ions such as tungsten (W), gold (Au) and lead (Pb) to investigate the attenuation characteristics of these composites. Near-surface composition depth profiling of ion-implanted epoxy systems was studied using Rutherford Backscattering Spectroscopy (RBS). The effect of implanted ions on the X-ray attenuation was studied with a general diagnostic X-ray machine with X-ray tube voltages from 40 to 100 kV at constant exposure 10 mAs. Results show that the threshold of implanted ions above which X-ray mass attenuation coefficient, µm of the ion-implanted epoxy composite is distinguishably higher than the µm of the pure epoxy sample is different for W, Au and Pb.

dc.publisherOxford University Press
dc.subjectX-ray shielding
dc.subjectX-ray mass attenuation coefficient
dc.subjectImplanted ions
dc.subjectNominal dose
dc.subjectImplanted dose
dc.titleSynthesis and characterisation of ion-implanted epoxy composites for X-ray shielding
dc.typeJournal Article
dcterms.source.titleNuclear Instruments and Methods in Physics Research B.
curtin.accessStatusFulltext not available

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