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    Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector

    Access Status
    Fulltext not available
    Authors
    Kirkwood, H.
    de Jonge, M.
    Muránsky, O.
    Hofmann, F.
    Howard, D.
    Ryan, C.
    van Riessen, G.
    Rowles, Matthew
    Paradowska, A.
    Abbey, B.
    Date
    2018
    Type
    Journal Article
    
    Metadata
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    Citation
    Kirkwood, H. and de Jonge, M. and Muránsky, O. and Hofmann, F. and Howard, D. and Ryan, C. and van Riessen, G. et al. 2018. Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector. Acta Materialia. 144: pp. 1-10.
    Source Title
    Acta Materialia
    DOI
    10.1016/j.actamat.2017.10.025
    ISSN
    1359-6454
    School
    Department of Physics and Astronomy
    URI
    http://hdl.handle.net/20.500.11937/58842
    Collection
    • Curtin Research Publications
    Abstract

    © 2017 Acta Materialia Inc. Interactions between neighboring grains influence the macroscale behavior of polycrystalline materials, particularly their deformation behavior, damage initiation and propagation mechanisms. However, mapping all of the critical material properties normally requires that several independent measurements are performed. Here we report the first grain mapping of a polycrystalline foil using a pixelated energy-dispersive X-ray area detector, simultaneously measuring X-ray fluorescence and diffraction with the Maia detector in order to determine grain orientation and estimate lattice strain. These results demonstrate the potential of the next generation of X-ray area detectors for materials characterization. By scanning the incident X-ray energy we investigate these detectors as a complete solution for simultaneously mapping the crystallographic and chemical properties of the sample. The extension of these techniques to broadband X-ray sources is also discussed.

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