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    Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

    Access Status
    Fulltext not available
    Authors
    Kirkwood, H.
    de Jonge, M.
    Howard, D.
    Ryan, C.
    van Riessen, G.
    Hofmann, F.
    Rowles, Matthew
    Paradowska, A.
    Abbey, B.
    Date
    2017
    Type
    Journal Article
    
    Metadata
    Show full item record
    Citation
    Kirkwood, H. and de Jonge, M. and Howard, D. and Ryan, C. and van Riessen, G. and Hofmann, F. and Rowles, M. et al. 2017. Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector. Powder Diffraction. 32 (S2): pp. S16-S21.
    Source Title
    Powder Diffraction
    DOI
    10.1017/S0885715617000768
    ISSN
    0885-7156
    School
    School of Electrical Engineering, Computing and Mathematical Science (EECMS)
    URI
    http://hdl.handle.net/20.500.11937/60260
    Collection
    • Curtin Research Publications
    Abstract

    Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil.

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