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dc.contributor.authorKirkwood, H.
dc.contributor.authorde Jonge, M.
dc.contributor.authorHoward, D.
dc.contributor.authorRyan, C.
dc.contributor.authorvan Riessen, G.
dc.contributor.authorHofmann, F.
dc.contributor.authorRowles, Matthew
dc.contributor.authorParadowska, A.
dc.contributor.authorAbbey, B.
dc.identifier.citationKirkwood, H. and de Jonge, M. and Howard, D. and Ryan, C. and van Riessen, G. and Hofmann, F. and Rowles, M. et al. 2017. Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector. Powder Diffraction. 32 (S2): pp. S16-S21.

Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil.

dc.publisherInternational Centre for Diffraction Data
dc.titlePolycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector
dc.typeJournal Article
dcterms.source.titlePowder Diffraction
curtin.departmentSchool of Electrical Engineering, Computing and Mathematical Science (EECMS)
curtin.accessStatusFulltext not available

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