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Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films

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2017
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Journal Article

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Wang, X. and Van Riessen, A. 2017. Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films. Powder Diffraction. 32 (S2): pp. S9-S15.
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Powder Diffraction
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School of Electrical Engineering, Computing and Mathematical Science (EECMS)
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