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dc.contributor.authorWang, Xiaodong
dc.contributor.authorVan Riessen, Arie
dc.date.accessioned2018-12-13T09:10:15Z
dc.date.available2018-12-13T09:10:15Z
dc.date.created2018-12-12T02:46:41Z
dc.date.issued2017
dc.identifier.citationWang, X. and Van Riessen, A. 2017. Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films. Powder Diffraction. 32 (S2): pp. S9-S15.
dc.identifier.urihttp://hdl.handle.net/20.500.11937/71466
dc.identifier.doi10.1017/S0885715617001117
dc.publisherInternational Centre for Diffraction Data
dc.relationhttps://www.cambridge.org/core/journals/powder-diffraction/article/omegaphi-compensated-gid-in-side-inclination-mode-for-measurement-of-residual-stress-in-polycrystalline-thin-films/CC62C6CCBEEFC32B75F3D0DA77E831EE
dc.titleOmega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films
dc.typeJournal Article
dcterms.source.volume32
dcterms.source.numberS2
dcterms.source.startPageS9
dcterms.source.endPageS15
dcterms.source.issn0885-7156
dcterms.source.titlePowder Diffraction
curtin.departmentSchool of Electrical Engineering, Computing and Mathematical Science (EECMS)
curtin.accessStatusFulltext not available


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